1994
DOI: 10.1016/0168-9002(94)91787-6
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A survey of the physical processes which determine the response function of silicon detectors to alpha particles

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Cited by 46 publications
(11 citation statements)
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“…The complexity of estimating the overall effect of these factors, especially given the use of a thick degrader, together with the potential sensitivity of the subsequent analysis on correct determination of the energies and energy resolutions, warranted the development of a dedicated Monte Carlo simulation of the above effects. Energy losses, energy straggling and angular straggling were based on SRIM2008.04 [12], the intrinsic energy resolution of the detectors was 15 keV for protons and 25 keV for alpha particles [13], and the beam divergence (0.5 degrees) and beam spot size (10 mm) were determined during the experiment. Target and degrader thicknesses were determined with calibrated alpha-particle energy loss measurements and cross-checked by measurements of mass per unit area.…”
Section: Figmentioning
confidence: 99%
“…The complexity of estimating the overall effect of these factors, especially given the use of a thick degrader, together with the potential sensitivity of the subsequent analysis on correct determination of the energies and energy resolutions, warranted the development of a dedicated Monte Carlo simulation of the above effects. Energy losses, energy straggling and angular straggling were based on SRIM2008.04 [12], the intrinsic energy resolution of the detectors was 15 keV for protons and 25 keV for alpha particles [13], and the beam divergence (0.5 degrees) and beam spot size (10 mm) were determined during the experiment. Target and degrader thicknesses were determined with calibrated alpha-particle energy loss measurements and cross-checked by measurements of mass per unit area.…”
Section: Figmentioning
confidence: 99%
“…This is generally done by applying the Gaussian energy broadening (GEB) method (Xu and Eckerman, 2009), via multiplication of each individual energy bin value with a normalized Gaussian function. It is noted that, however, when just considering the behavior of the silicon detector the response is not strictly Gaussian (Steinbauer et al, 1994). The standard deviation s of the applied Gaussian, is related to the FWHM energy resolution DE of the detector system via DE ¼ 2 ffiffiffiffiffiffiffiffiffiffiffiffi ffi 2 ln 2 p s. The energy resolution of the system was experimentally determined to be DE ¼ 200 keV for device with Geo1 and DE ¼ 150 keV for device with Geo2.…”
Section: Energy Spectra Dependence On Electronicsmentioning
confidence: 99%
“…The alpha spectroscopy electronics used here was only sensitive from 3 -6 MeV which does not allow a direct measurement of the conversion electron spectra. However, it is widely accepted that the structure on the high-energy side distribution of 241 Am alpha spectroscopy is mainly due to alpha-CE coincidences [1], [6], [7] and not alpha-photon coincidences. This is due to the high detection efficiency of a silicon detector of an electron as compared to a photon.…”
Section: Experimental Measurementsmentioning
confidence: 99%