1992
DOI: 10.1149/1.2069306
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A Surface Silylated Single‐layer Resist Based on Limited Gas Permeation for Limited Penetration EB Lithography

Abstract: One single thick layer of resist polymer was surface-silylated to get a bilevel structure which functioned similarly to the bilayer resist composed of the Si-containing top imaging and the bottom planarizing layers. A resist or matrix polymer layer containing phenolic --OH groups was silylated by exposing to hexamethyl disilazane vapor, and Si atoms were effectively incorporated in the surface sublayer by limited gas permeation and reaction with the --OH groups. 02 RIE durability of the silylated poly(vinyl ph… Show more

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Cited by 4 publications
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“…The durability of the silylated PVP layer was 23 during the first 38-40 min, and then suddenly decreased to 1.0 of SSS Resist based on (the etching rate increased and was equal to that of unsilylated layer). when the distribution of incorporated silicon atoms was considered as was discussed in the previous papers [1,3], it was obvious that the rate increase was caused by a decrease in S i content.…”
Section: Results and Discussion 41 Distribution Of Silicon Incorporamentioning
confidence: 99%
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“…The durability of the silylated PVP layer was 23 during the first 38-40 min, and then suddenly decreased to 1.0 of SSS Resist based on (the etching rate increased and was equal to that of unsilylated layer). when the distribution of incorporated silicon atoms was considered as was discussed in the previous papers [1,3], it was obvious that the rate increase was caused by a decrease in S i content.…”
Section: Results and Discussion 41 Distribution Of Silicon Incorporamentioning
confidence: 99%
“…The PVP layer was placed on the holder in the home-made reactor reported in our previous study [3], kept in vacuo at 40°C for 20 h, and then silylated by introducing hexamethyldisilazane (HMDS) vapor under 80100 Torr into the chamber at 70°C for 2040 min.…”
Section: Experimental 31 Vapor-phase Silylationmentioning
confidence: 99%