1998
DOI: 10.1021/jp9829997
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A Surface Science Study of Model Catalysts. 2. Metal−Support Interactions in Cu/SiO2Model Catalysts

Abstract: The thermal stability of wet-chemically prepared Cu/SiO2 model catalysts containing nanometer-sized Cu particles on silica model supports was studied upon heating in hydrogen and ultrahigh vacuum. The surface and interface phenomena that occur are determined by the metal−support interactions. Heating in hydrogen results in a reduction of the metal−support interaction and sintering occurs via Cu particle migration at 350 °C. Annealing in ultrahigh vacuum up to 620 °C does not result in sintering of the Cu parti… Show more

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Cited by 36 publications
(32 citation statements)
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References 89 publications
(173 reference statements)
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“…19,20 If the SiO 2 layer is not thick enough, the direct reaction between Cu and SiO 2 may compete with Cu diffusion through the SiO 2 layer to the SiO 2 /Si interface where silicide is formed, as described by Dallaporta et al 21 For Cu particles on a 5 nm SiO 2 layer on top of a Si͑100͒ wafer, we have clearly observed Cu interdiffusion in the Si substrate after UHV annealing up to 620°C. 4 Due to the wet-chemical preparation, Cu is fairly strongly attached to SiO 2 since no sintering of the Cu particles is observed during UHV annealing, and we believe that the silicide formation starts at the metal-support interface. Strongly bonded Cu may catalyze the Si-O bond breaking, since Cu also catalyzes the reverse reactions of Si-O formation.…”
Section: Fig 2 Aes Results Of Amentioning
confidence: 81%
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“…19,20 If the SiO 2 layer is not thick enough, the direct reaction between Cu and SiO 2 may compete with Cu diffusion through the SiO 2 layer to the SiO 2 /Si interface where silicide is formed, as described by Dallaporta et al 21 For Cu particles on a 5 nm SiO 2 layer on top of a Si͑100͒ wafer, we have clearly observed Cu interdiffusion in the Si substrate after UHV annealing up to 620°C. 4 Due to the wet-chemical preparation, Cu is fairly strongly attached to SiO 2 since no sintering of the Cu particles is observed during UHV annealing, and we believe that the silicide formation starts at the metal-support interface. Strongly bonded Cu may catalyze the Si-O bond breaking, since Cu also catalyzes the reverse reactions of Si-O formation.…”
Section: Fig 2 Aes Results Of Amentioning
confidence: 81%
“…Strongly bonded Cu may catalyze the Si-O bond breaking, since Cu also catalyzes the reverse reactions of Si-O formation. 13,14,[16][17][18] Metal evaporation as applied by others 9,21 may result in a weaker metal-support interaction 4 and, therefore, not result in a reaction between Cu and SiO 2 during UHV annealing. We note that also impurities on the sample surface or constituents of the residual gas may help to reduce SiO 2 .…”
Section: Fig 2 Aes Results Of Amentioning
confidence: 98%
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“…47 gives the schematic description of the processes which could happen at metal/SiO 2 /Si model systems. The typical chemical interactions described in Section 2.3.1, which include redox reaction, alloy formation, encapsulation, and interdiffusion, have been observed at metal-SiO 2 interfaces [100,593].…”
Section: Chemical Interaction Of Metals On Silica Filmsmentioning
confidence: 99%
“…Using such a flat model catalyst has advantages on the parallel use of other surface science tools. For example, according to the work by van van den Oetellar [12], the MSI (metal-support interaction) was verified by the Cu/SiO 2 model catalysts prepared by spin coating. In addition, Brookshier and Goodman [13] reported the control of CuO particle size on SiO 2 by using spin coating method.…”
Section: Introductionmentioning
confidence: 99%