2024
DOI: 10.1051/itmconf/20246701002
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A study on the performances of the run sum chart under the gamma process

Kai Le Goh,
Lin Wei Teoh,
Lin Zhi Chong
et al.

Abstract: The run sum (RS) X̄ chart is known as a simple and powerful tool for monitoring the mean of a process. Most developments of the RS X̄ chart assume that the underlying process comes from a normal distribution. However, in practice, many processes tend to follow a non-normal distribution. These non-normal processes affect the performances of control charts under the design of normal distribution. In this paper, we present a detailed analysis on the performances of the RS X̄ chart when the underlying data come fr… Show more

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