2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3m-Nano) 2023
DOI: 10.1109/3m-nano58613.2023.10305345
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A Study on the Multi-parameter Modulation of the Light Field in 4+1 Beam Laser Interference

He Wen,
Li Li,
Lu Wang
et al.
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