2009
DOI: 10.1117/12.850056
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A study on the Cl 2 /C 2 H 4 /Ar plasma etching of ITO using inductively coupled plasma

Abstract: In this study, the indium tin oxide (ITO) was etched by an inductively coupled plasma (ICP) etcher using Cl 2 /C 2 H 4 /Ar as the etching gases. The etch rates were studied as a function of RF power, inductively coupled plasma (ICP) source power, working pressure and gas mixing ratio. We found that the RF Power plays a dominant role in the elevation of the etch rates, which indicates that the ITO etching in this study is a physical mechanism dominated etching.The state of the photoresist (PR) was observed afte… Show more

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Cited by 3 publications
(2 citation statements)
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“…However, it lacks selectivity. Further investigation led to the identification of the optimal ITO/photoresist etching selectivity using He/Ar [28,29]. Figure 3 shows the roughness of the etched ITO in the active area and that of the unetched ITO part, which is Rq = 4.6 nm (Ra = 3.8 nm) and Rq = 5.5 nm (Ra = 4.4 nm), respectively.…”
Section: • Ito Thinning Processmentioning
confidence: 99%
“…However, it lacks selectivity. Further investigation led to the identification of the optimal ITO/photoresist etching selectivity using He/Ar [28,29]. Figure 3 shows the roughness of the etched ITO in the active area and that of the unetched ITO part, which is Rq = 4.6 nm (Ra = 3.8 nm) and Rq = 5.5 nm (Ra = 4.4 nm), respectively.…”
Section: • Ito Thinning Processmentioning
confidence: 99%
“…3,4) The problems inherent in this ITO etching method, however, are its low etch rate and low selectivity against hard-mask materials. 5,6) To solve these problems, herein we investigated the effect of the hydrogen-induced modified layer for cyclic, multistep thin-layer etching. One of the advantages of cyclic etching is the possibility of adjusting the ion energy in each step; thus, highly selective etching can be expected.…”
Section: Introductionmentioning
confidence: 99%