2005
DOI: 10.1016/j.jasms.2005.03.022
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A study on mass spectrometry of methylated [60] fullerenes using the “in-beam” electron impact technique

Abstract: Mass spectra of the methylated [60]fullerenes were obtained by EI mass spectrometry using "desorption" or "in-beam" technique. The mass spectra of the methylated fullerenes, C 60 Me n , have the molecular ion peak M ϩ indicating that the product is stable under the MS (EI) conditions. The appearance of an intense peak at m/z 360 was assigned to the formation of fullerene dication C 60 ϩϩ . The remaining peaks were assigned to successive loss of methyl groups from molecular monocation and dication. A lkylation … Show more

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