2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) 2015
DOI: 10.1109/icstw.2015.7107429
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A study on an approach for analysing test basis using I/O test data patterns

Tsuyoshi Yumoto
1
,
Tohru Matsuodani2,
Kazuhiko Tsuda
3
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Cited by 3 publications
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Utilization of automatic test case generation methods for various system specifications

Fujita,
Ueda
2024
The 3RD INTERNATIONAL CONFERENCE ON NATURAL SCIENCES, MATHEMATICS, APPLICATIONS, RESEARCH, AND TECHNOLOGY (ICON-SMART2022): Mat
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Utilization of automatic test case generation methods for various system specifications

Fujita,
Ueda
2024
The 3RD INTERNATIONAL CONFERENCE ON NATURAL SCIENCES, MATHEMATICS, APPLICATIONS, RESEARCH, AND TECHNOLOGY (ICON-SMART2022): Mat
0
0
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Analysing Test Basis and Deriving Test Cases Based on Data Design Documents

Yumoto
1
,
Matsuodani2,
Tsuda
3
2017
2017 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
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A Method of Deriving Procedural Combinations Test Cases from Tasks that are Sharing Data

Yumoto1,
Uetsuki2,
Matsuodani3
et al. 2017
IEEJ Trans.EIS
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