A Study of the Dielectric Properties of the Silver-Tantalate-Niobate Thick Films

Abstract

Low loss perovskite niobates and tantalates have been placed on a short list of functional materials for future technologies. In this study, we fabricated Ag(Ta,Nb)O3 thick films on the Al2O3 substrates by the screen printing method. The Ag(Ta,Nb)O3 powders were fabricated by the mixed oxide method. The sintering temperature and time were 1150°C and 2 hrs, respectively. The results of XRD analysis showed that the specimens employed in this study had the pesudo cubic structure. The dielectric permittivity and loss tangent of the films have been characterized from 1 kHz to 1 MHz. Also the dielectric permittivity and loss tangent were measured from 303 K to 393 K. The electrical properties of the film are also discussed.