A study of the degradation of polymers irradiated by Cn+ and On+ 9.6 MeV heavy ions

Mikšová, Romana; Macková, Anna; Malínský, P.; Slepička, Petr; Švorčı́k, Václav

doi:10.1016/j.polymdegradstab.2015.10.017

Cited by 19 publications

(21 citation statements)

References 34 publications

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“…This particular advantage was utilized number times in the investigation of the surface deterioration due to exposition to a certain media. The impact of the UV light [3][4][5][6][7], simulated solar radiation [8], high voltage [9], complex environmental conditions [10] increased temperature [11,12] and others [13][14][15] was investigated, allowing to observe the topography changes indicating the intensity of the materials response. Also the changes of the mechanical properties at nanoscale were reported as the result of the environmental conditions [3,7] or local, nanoscale wear [16].…”

Section: Introductionmentioning

confidence: 99%

“…One can notice that the common practice is the assumption that micrometer scale measurements acquired in various areas of the sample will be representative for whole specimen. Therefore in many works, single or very few measurements were used to calculate the roughness changes [5,8,[10][11][12][13]. Among few works investigating the degradation process, and showing the gradual roughness changes, one could notice rather monotonic behavior, visible as the increase of S a or S q parameters [13,[19][20].…”

Section: Introductionmentioning

confidence: 99%

“…Therefore in many works, single or very few measurements were used to calculate the roughness changes [5,8,[10][11][12][13]. Among few works investigating the degradation process, and showing the gradual roughness changes, one could notice rather monotonic behavior, visible as the increase of S a or S q parameters [13,[19][20]. Some works, however, reported much more complex degradation phenomena [6,10,21].…”

Section: Introductionmentioning

confidence: 99%

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High Accuracy and Sensitivity Method of the Observation of the Surface’s Morphology Changes by Means of Atomic Force Microscopy with Cyclic, Precise Sample Positioning

Sikora¹

2017

NSNM

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Abstract:The submicron changes of the morphological properties of the surface can provide one of the earliest indications of the degradation of the material due exposition to a certain media. Atomic force microscopy, as the tool delivering 3D quantitative imaging of the surface with ultimate resolution, is successfully utilized in the detection of the materials degradation. Yet, a several issues such as the materials non-homogeneity and the presence of the morphological artifacts must be taken into account in terms of the reliability of obtained data, while their presence in the scanned area may cause a significant deviation of the measurement outcome from the values being representative to the condition of the investigated material. In this paper the approach based on the precise sample positioning at each stage of the verification of the deterioration progress is presented. This novel method allows to acquire the information with unique sensitivity and high degree of confidence. Moreover, the observation of the morphology changes at several spots with high receptivity enables determination of the homogeneity of the deterioration, which may play essential role in case of investigation of behavior of complex materials (containing additives or fillers), in particular nanomaterials. A set of experimental results acquired on the polycarbonate and polyethylene samples is here presented, revealing the efficiency of presented approach and its advantages over the commonly applied methods.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

High Accuracy and Sensitivity Method of the Observation of the Surface’s Morphology Changes by Means of Atomic Force Microscopy with Cyclic, Precise Sample Positioning

Sikora¹

2017

NSNM

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“…Overall, the properties depend on the initial polymer structure and the implanted species. For C 4+ and O 4+ irradiation of poly(etheretherketone) (PEEK), polypropylene (PP), polyethyleneterephthalate (PET), and PC, PP has the lowest resistance to irradiation damage while the most important compositional changes occur in PC [6]. For sensors, B + irradiation of polyimide (PI) and polyethersulfone improves the moisture uptake in the films [7].…”

Section: Introductionmentioning

confidence: 99%

Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy

Philipp¹,

Rzeznik²,

Wirtz³

2016

Beilstein J. Nanotechnol.

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The analysis of polymers by secondary ion mass spectrometry (SIMS) has been a topic of interest for many years. In recent years, the primary ion species evolved from heavy monatomic ions to cluster and massive cluster primary ions in order to preserve a maximum of organic information. The progress in less-damaging sputtering goes along with a loss in lateral resolution for 2D and 3D imaging. By contrast the development of a mass spectrometer as an add-on tool for the helium ion microscope (HIM), which uses finely focussed He+ or Ne+ beams, allows for the analysis of secondary ions and small secondary cluster ions with unprecedented lateral resolution. Irradiation induced damage and depth profiling capabilities obtained with these light rare gas species have been far less investigated than ion species used classically in SIMS. In this paper we simulated the sputtering of multi-layered polymer samples using the BCA (binary collision approximation) code SD_TRIM_SP to study preferential sputtering and atomic mixing in such samples up to a fluence of 1018 ions/cm2. Results show that helium primary ions are completely inappropriate for depth profiling applications with this kind of sample materials while results for neon are similar to argon. The latter is commonly used as primary ion species in SIMS. For the two heavier species, layers separated by 10 nm can be distinguished for impact energies of a few keV. These results are encouraging for 3D imaging applications where lateral and depth information are of importance.

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“…The swift heavy ions lead to irreversible chemical reactions in the implanted polymer in terms of cross-linking, chain scission, generation of sp 2 and sp 3 hybridization, and finally, amorphization or graphitization of the subsurface layer [4][5][6].…”

Section: Introductionmentioning

confidence: 99%

Surface topographical and structural analysis of Ag+-implanted polymethylmethacrylate

Arif

Rafique

Saleemi

et al. 2016

Nuclear Instruments and Methods in Physics Research Section B:

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A study of the degradation of polymers irradiated by Cn+ and On+ 9.6 MeV heavy ions

Cited by 19 publications

References 34 publications

High Accuracy and Sensitivity Method of the Observation of the Surface’s Morphology Changes by Means of Atomic Force Microscopy with Cyclic, Precise Sample Positioning

High Accuracy and Sensitivity Method of the Observation of the Surface’s Morphology Changes by Means of Atomic Force Microscopy with Cyclic, Precise Sample Positioning

Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy

Surface topographical and structural analysis of Ag+-implanted polymethylmethacrylate

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