2014
DOI: 10.5370/jeet.2014.9.6.1995
|View full text |Cite
|
Sign up to set email alerts
|

A Study of Field-Ring Design using a Variety of Analysis Method in Insulated Gate Bipolar Transistor (IGBT)

Abstract: -Power semiconductor devices have been the major backbone for high-power electronic devices. One of important parameters in view of power semiconductor devices often characterize with a high breakdown voltage. Therefore, many efforts have been made, since the development of the Insulated Gate Bipolar Transistor (IGBT), toward having higher level of breakdown voltage, whereby the typical design thereof is focused on the structure using the field ring. In this study, in an attempt to make up more optimized field… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 22 publications
0
2
0
Order By: Relevance
“…It is necessary to have an edge termination structure that will reduce the electric field crowding at the diode and IGBT edges. 13,14 A termination design based on the biased ring concept was employed in the design of the HV diode/IGBT chips. A diode was viewed under a microscope and the width of the guard rings and the gaps between the rings served as a guide in the simulation of the diodes guard rings and edge termination.…”
Section: Field Distribution Simulationmentioning
confidence: 99%
See 1 more Smart Citation
“…It is necessary to have an edge termination structure that will reduce the electric field crowding at the diode and IGBT edges. 13,14 A termination design based on the biased ring concept was employed in the design of the HV diode/IGBT chips. A diode was viewed under a microscope and the width of the guard rings and the gaps between the rings served as a guide in the simulation of the diodes guard rings and edge termination.…”
Section: Field Distribution Simulationmentioning
confidence: 99%
“…To design a system with breakdown voltage having a higher field ring, the depth of junction should be as deep as possible. 14 The depth of the p-well (junction) in the diode was assumed to be 20 µm. Figure 2 shows the meshed field limiting ring (also shown schematically in Figure 1) that divides the entire space into a small rectangular size for calculation using the FEM.…”
Section: Field Distribution Simulationmentioning
confidence: 99%