A Student’s Introduction to Resonant Inelastic Soft X-ray Scattering

Chiuzbăian, S. G.

doi:10.1007/978-3-319-03032-6_6

Cited by 1 publication

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“…For example, the M-edge VUV resonant inelastic X-ray scattering (RIXS) spectrum of NiO in Fig. 1(a, right), shows a far weaker charge transfer peak than L-edge soft X-ray RIXS [4][5][6][7][8], and M-edge XAS from NiO has no obvious charge transfer derived spectral feature. Here, we will explore the question of how charge transfer states manifest in the VUV by varying the core hole modeling parameters of an atomic multiplet (AM) simulation for NiO, augmented by ligand hybridization treated in the single Anderson impurity model (SAIM).…”

Section: Introductionmentioning

confidence: 99%

Charge transfer excitations in VUV and soft X-ray resonant scattering spectroscopies

Augustin

Miao

et al. 2017

Journal of Electron Spectroscopy and Related Phenomena

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The utility of resonant scattering for identifying electronic symmetries and density distributions changes dramatically as a function of photon energy. In the hard X-ray regime, strong core hole monopole potentials tend to produce X-ray absorption features with well defined electron number on the scattering site. By contrast, in the vacuum ultraviolet (VUV), resonant scattering from Mott insulators tends to reveal spectra that are characteristic of only the nominal valence, and are insensitive to deviations from nominal valence brought on by metal-ligand hybridization. Here, atomic multiplet simulations are used to investigate the interplay of monopolar and mulitpolar Coulomb interactions in the VUV and soft X-ray regimes, to identify how charge transfer thresholds and other signatures of mixed valence can manifest in this low photon energy regime. The study focuses on the Mott insulator NiO as a well characterized model system, and extrapolates interactions into non-physical regimes to identify principles that shape the spectral features.

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