2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2023
DOI: 10.1109/ipfa58228.2023.10249062
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A Strategic Framework for Evaluating Data Augmentation in Microscopic IC Image Analysis

Yee-Yang Tee,
Chye-Soon Chee,
Deruo Cheng
et al.
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