A statistical design methodology of a 0.12-μm CMOS device for MPU applications

Fukuda, Takahiro; Honzawa, A.; Wada, Satoshi; Mori, K.; Kunitomo, K.; Sato, Hidetoshi

doi:10.1109/iwstm.2001.933826

2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550)

DOI: 10.1109/iwstm.2001.933826

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A statistical design methodology of a 0.12-μm CMOS device for MPU applications

Takahiro Fukuda

A. Honzawa²,

Satoshi Wada³

et al.

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A statistical design methodology of a 0.12-μm CMOS device for MPU applications

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References 3 publications

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