A stabler non contact atomic force microscopy imaging using a tuning fork for air and liquid environments: The <i>zero</i> phase mode atomic force microscopy

Van, L. Pham; Kyrylyuk, V.; Thoyer, François; Cousty, J.

doi:10.1063/1.2986152

Cited by 21 publications

(10 citation statements)

References 21 publications

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“…On the other hand, high-Q or vacuum environments are especially beneficial to the PM-or FM-AFM modes. These modes can nonetheless be effective in low-Q environments, as shown by the efforts to improve their performance in liquids with PM-AFM 39 or in shear-force imaging. 40 QTF probes can sense forces down to the pico-Newton range, and resolutions down to 30 pN were reported 41 as early as 1999.…”

Section: Qtf Probe Applicationsmentioning

confidence: 99%

Contributed Review: Quartz force sensing probes for micro-applications

Abrahamians

Van

Régnier

2016

Review of Scientific Instruments

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As self-sensing and self-exciting probes, quartz sensors present many advantages over silicon cantilevers for microscopy, micro-robotics, and other micro-applications. Their development and use is further bolstered by the fact that they can be manufactured from common quartz components. This paper therefore reviews applications of the increasingly popular quartz tuning fork probes as force sensors in the literature and examines the options for higher-frequency quartz probes using the other available types of flexional, thickness-shear or length-extensional resonators.

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Section: Qtf Probe Applicationsmentioning

confidence: 99%

Contributed Review: Quartz force sensing probes for micro-applications

Abrahamians

Van

Régnier

2016

Review of Scientific Instruments

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“…Furthermore, Holscher [11] proved that Q-control and AGC circuits can be applied to PM-AFM to further enhance the stability and precision of the scanning process. In 2008, Van et al [12] used PM-AFM to scan monocrystalline and in 2010, Li [13] used this technique to investigate polymer surfaces. Lee reconstructed the highly oriented topography of pyrolytic graphite (HOPG) in 2011 [14].…”

Section: Introductionmentioning

confidence: 99%

Design and Control of Phase-Detection Mode Atomic Force Microscopy for Reconstruction of Cell Contours in Three Dimensions

Chen

Chiang

et al. 2014

IEEE Trans. Nanotechnology

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Atomic force microscopy (AFM) is capable of producing accurate 3-D images at nanometer resolution. As a result, AFM is widely used in applications related to cell biology, such as the diagnosis and observation of tumor cells. This paper proposes phase-detection mode atomic force microscopy (PM-AFM) for the 3-D reconstruction of cell contours. The proposed threeaxis scanning system employs two piezoelectric stages with one and two degrees of freedom, respectively. Accurately rendering the contours of delicate cells required a multi-input multi-output (MIMO) adaptive double integral sliding mode controller (ADISMC) in the xy-plane to overcome uncertainties within the system as well as cross-coupling, hysteresis effect, and external disturbance. An adaptive complementary sliding-mode controller (ACSMC) was installed along the z axis to improve scanning accuracy and overcome the inconvenience of conventional controllers. Phase feedback signals were also used to increase the sensitivity of scanning, while providing faster response times and superior image quality. A comprehensive series of experiments was performed to validate the performance of the proposed system. Index Terms-Adaptive complementary sliding mode control (ACSMC), adaptive double integral sliding mode control, atomic force microscopy (AFM), CD/DVD pickup head, phase-detection mode.

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“…1. [16][17][18] In this experiment, a commercial intermittent contact mode AFM was operated as the FM-AFM using a phase locked loop ͑PLL͒ system. Between the bridge O atom rows, Ti atoms coordinated to five O atoms ͑fivefold-coordinated Ti atoms͒ are exposed.…”

Section: Introductionmentioning

confidence: 99%