A stabilized resistive voltage source for FDTD thin-wire models

Abstract

The von Neumann analysis is applied to investigate the stability of a source connected on a wire described by a thin-wire model. Both a soft source and a resistive voltage source (RVS) are shown to limit the stable range of values for wire radius or time step. Using the von Neumann analysis, a stable RVS model for thin wires is developed. The proposed model is verified by comparison with a hard source, an original RVS and NEC-generated reference data. The stabilized RVS introduces no additional stability constraints on those of the wire model while maintaining fast decay of incident fields of the original RVS model. Index Terms-Finite-difference time-domain (FDTD) methods, stability.