2016
DOI: 10.1088/2053-1591/3/10/106302
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A spectroscopic comparison of IGZO thin films and the parent In2O3, Ga2O3, and ZnO single crystals

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Cited by 10 publications
(14 citation statements)
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“…Near the resonance energy an electron from the N 1s core level is excited into the partially occupied CB from hybridization of N 2p–Pb 6p–I 5p states. For more details about the resPES method and the data analysis, the authors recommend the reader to refer to their previous works …”
Section: Resultsmentioning
confidence: 99%
“…Near the resonance energy an electron from the N 1s core level is excited into the partially occupied CB from hybridization of N 2p–Pb 6p–I 5p states. For more details about the resPES method and the data analysis, the authors recommend the reader to refer to their previous works …”
Section: Resultsmentioning
confidence: 99%
“…Furthermore, not only do the TCO single crystals show these close relations, but the models presented here can be generalized also for amorphous films (magnetron sputtering in Ar/O 2 ) of the IGZO family 16,18,19,21 and also to several oxidic ALD films, [22][23][24][25]29 as all show similar behavior as they exhibit a high optical transparency and an n-type conductivity with high values of the mobility. In addition, these systems are easy to mix (IGZO family) while the properties remain stable.…”
Section: F Generalization For the Tco Family-an Outlookmentioning
confidence: 53%
“…38,39 Second, we have identified the existence of CT-bands, excitons, and polaronic defects in all of the investigated TCO systems, including single crystalline and thin film materials. [15][16][17][18][19]21,33 This indicates that the mechanisms for the defect formation must be very similar, indeed. Furthermore, we find several indications of the spectroscopic features discussed in this contribution.…”
Section: F Generalization For the Tco Family-an Outlookmentioning
confidence: 96%
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