A spectrophotometric method for the characterisation of thin metallic layers and validation in the example case of titanium

Shurvinton, Riley; Lumeau, Julien; Lemarchand, Fabien; Moreau, Antonin

doi:10.1117/12.2596831

Advances in Optical Thin Films VII 2021

DOI: 10.1117/12.2596831

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A spectrophotometric method for the characterisation of thin metallic layers and validation in the example case of titanium

Riley Shurvinton

Julien Lumeau

Fabien Lemarchand

et al.

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A spectrophotometric method for the characterisation of thin metallic layers and validation in the example case of titanium

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