Proceedings of the 33rd Annual Conference on Design Automation Conference - DAC '96 1996
DOI: 10.1145/240518.240586
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A sparse image method for BEM capacitance extraction

Abstract: Boundary element methods (BEM) are often used for complex 3-D capacitance extraction because of their efficiency, ease of data preparation, and automatic handling of open regions. BEM capacitance extraction, however, yields a dense set of linear equations that makes solving via direct matrix methods such as Gaussian elimination prohibitive for large problem sizes. Although iterative, multipole-accelerated techniques have produced dramatic improvements in BEM capacitance extraction, accurate sparse approximatio… Show more

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Cited by 6 publications
(10 citation statements)
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“…As we will show, the shift-truncate potential method proposed in [1] and depicted in Fig. 3 yields such bounds.…”
Section: Bounds For Shift-truncatementioning
confidence: 66%
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“…As we will show, the shift-truncate potential method proposed in [1] and depicted in Fig. 3 yields such bounds.…”
Section: Bounds For Shift-truncatementioning
confidence: 66%
“…Several different techniques for the localization of the extracted capacitance have been developed, such as scanning methods [4] [7] which build capacitance databases of the elementary conductor constellations encountered in the circuit, and windowing techniques. This paper proves that the shift-truncate method from [1] and the windowing method yield opposite bounds for the exact values of the mutual and self capacitances. We also introduce the metal shell [2] featuring the same bounds as shift-truncate and the homogenously filled shell which provides a higher accuracy than shift-truncate [2] in many cases.…”
Section: Introductionmentioning
confidence: 65%
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