Abstract:As system-on-chip (SoC) integration is growing very rapidly, increased circuit densities in SoC have lead a radical increase in test data volume and reduction of this large test data volume is one of the biggest challenges in the testing industry. This paper presents an efficient test independent compression scheme primarily based on the error correcting Hamming codes. The scheme operates on the pre-computed test data without the need of structural information of the circuit under test and thus it is applicabl… Show more
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