2016
DOI: 10.1080/03717453.2015.1104056
|View full text |Cite
|
Sign up to set email alerts
|

A single-step trans-vertical epoxy preparation method for maximising throughput of iron-ore samples via SEM-MLA analysis

Abstract: A novel approach to creating a trans-vertical grain mount embedded in epoxy has been demonstrated through the creation of a new mounting mould, as well as a polisher adapter and sample holder for the Quanta 400 SEM. These rectangular moulds result in a sample that is 30 mm long × 10 mm high × 17 mm wide, thus leading to the ability to polish 10 samples at once. Up to 14 samples may fit in the SEM holder for analysis. This represents an increase in efficiency of over 50%, and with a slow-speed polishing method,… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
21
0

Year Published

2017
2017
2022
2022

Publication Types

Select...
8

Relationship

1
7

Authors

Journals

citations
Cited by 10 publications
(21 citation statements)
references
References 4 publications
(5 reference statements)
0
21
0
Order By: Relevance
“…We suggest that such ideal blocks can be either cubical or rectangular. Grant et al [24] already designed such rectangular prismshaped blocks to expose vertical sections for MLA analyses.…”
Section: Conclusion and Recommendationsmentioning
confidence: 99%
“…We suggest that such ideal blocks can be either cubical or rectangular. Grant et al [24] already designed such rectangular prismshaped blocks to expose vertical sections for MLA analyses.…”
Section: Conclusion and Recommendationsmentioning
confidence: 99%
“…The standard sample preparation for mineral samples has involved mounting material in a 30-32 mm diameter round epoxy mount and polishing the surface [3]. More recently, trans-vertical mounting has become accepted as a more accurate method for sample preparation in order to avoid bias from density settling [4][5][6][7][8]. A case study is presented here to further support the use of single step trans-vertical mounting to reduce sample bias and increase analysis throughput.…”
Section: Introductionmentioning
confidence: 99%
“…Test 5: The use of transverse sections is investigated, where the original section is cut vertically and the two halves generated are turned 90 • and mounted in a new resin-encapsulated polished section, exposing the vertical profile of the original section. It is hypothesized that this may reduce or eliminate the effect of particle segregation in the original section (e.g., Kwitko-Ribeiro [42]; Blaskovich [16]; Grant et al [43]). iv.…”
Section: Mineralogical Analyses By Qemscan ®mentioning
confidence: 99%