2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) 2019
DOI: 10.1109/pvsc40753.2019.8981249
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A simplified contactless method for outdoor photoluminescence imaging

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Cited by 3 publications
(2 citation statements)
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“…EL and PL imaging unveil crucial details concerning performance-limiting faults, including micro-cracks, recombination, series resistance, and shunts [55]. The disparity between PL and EL lies in the clarity of defect details.…”
Section: Pl Imagingmentioning
confidence: 99%
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“…EL and PL imaging unveil crucial details concerning performance-limiting faults, including micro-cracks, recombination, series resistance, and shunts [55]. The disparity between PL and EL lies in the clarity of defect details.…”
Section: Pl Imagingmentioning
confidence: 99%
“…Recent PL imaging techniques effectively investigate failure mechanisms like local series resistance issues and bypass diode failure in open-circuit conditions, critical for solar module analysis. However, further technological development is required for the commercial deployment of other methods like outdoor PL without modulation and inverter switching [55,58,59].…”
Section: Pl Imagingmentioning
confidence: 99%