1993
DOI: 10.1016/0969-8078(93)90155-w
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A simple technique to discriminate various charged particles using SSNTDs

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Cited by 4 publications
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“…The formation of etchable tracks in a track detector depends on certain critical etching parameters which must be experimentally determined under suitable etching conditions. The determination of critical etching parameters is essential for applications of track detectors in diverse fields such as micro-analysis (Chambaudet et al, 1995); particle identification (Majeed et al, 1993); and in determination of the true track length of heavy ions (Dwivedi and Mukherji, 1979;Singh et al, 1988 andBhattacharyya et al, 1992).…”
Section: Introductionmentioning
confidence: 99%
“…The formation of etchable tracks in a track detector depends on certain critical etching parameters which must be experimentally determined under suitable etching conditions. The determination of critical etching parameters is essential for applications of track detectors in diverse fields such as micro-analysis (Chambaudet et al, 1995); particle identification (Majeed et al, 1993); and in determination of the true track length of heavy ions (Dwivedi and Mukherji, 1979;Singh et al, 1988 andBhattacharyya et al, 1992).…”
Section: Introductionmentioning
confidence: 99%