2022
DOI: 10.1016/j.talanta.2022.123354
|View full text |Cite
|
Sign up to set email alerts
|

A simple method for glass analysis using total reflection X-ray fluorescence spectrometry

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
5
0

Year Published

2022
2022
2025
2025

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 9 publications
(5 citation statements)
references
References 32 publications
0
5
0
Order By: Relevance
“…The analytical performance of the method was comparable to ICP‐MS, with the added advantage of minimal sample preparation and not requiring calibration. Some additional benefits of TXRF are negligible matrix and no memory effect, fast and simultaneous multi‐elemental analysis with limits of detection for the elements of interest on glass ranging from 0.3 to 8 ppm (Costa et al, 2022).…”
Section: Emerging Methods For the Analysis Of Glassmentioning
confidence: 99%
“…The analytical performance of the method was comparable to ICP‐MS, with the added advantage of minimal sample preparation and not requiring calibration. Some additional benefits of TXRF are negligible matrix and no memory effect, fast and simultaneous multi‐elemental analysis with limits of detection for the elements of interest on glass ranging from 0.3 to 8 ppm (Costa et al, 2022).…”
Section: Emerging Methods For the Analysis Of Glassmentioning
confidence: 99%
“…A simple TXRF method of glass analysis that was capable of multi-elemental analysis, that consumed low amounts of reagents and did not require a calibration curve was presented by Costa et al 164 These authors used central composite design (a statistical method often used to optimize parameters) to optimize the sample grinding procedure, with optimal values being 1 g of sample, grinding in a ball mill for 6 min and at an impact frequency of 23 Hz. Once the optimal parameters had been established, 10 mg of ground sample was placed in a tube and 990 μL of aqueous 1.0% v/v Triton X-114 solution added.…”
Section: Inorganic Materialsmentioning
confidence: 99%
“…Costa et al [ 173 ] report the use of total reflection X-ray fluorescence (TXRF) for the analysis of Na, Mg, Al, K, Ca, Ti, V, Cr, Mn, Ni, Cu, Zn, Rb, Sr, Ba and Pb concentrations in glass samples. The authors report that the limit of detection (LOD) and limit of quantification (LOQ) were “adequate” for determination of trace elements in glass.…”
Section: Introductionmentioning
confidence: 99%