A Simple and Direct Method for Interface Characterization of OFETs

Srinivas, P.; Tiwari, Shree Prakash; Raval, Harshil N.; Ramesh, R.; Cahyadi, Tommy; Mhaisalkar, Subodh; Rao, V. Ramgopal

doi:10.1109/ipfa.2007.4378107

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits 2007

DOI: 10.1109/ipfa.2007.4378107

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A Simple and Direct Method for Interface Characterization of OFETs

P. Srinivas

Shree Prakash Tiwari

Harshil N. Raval

et al.

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A Simple and Direct Method for Interface Characterization of OFETs

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References 9 publications

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