1999
DOI: 10.1109/16.766877
|View full text |Cite
|
Sign up to set email alerts
|

A short-channel DC SPICE model for polysilicon thin-film transistors including temperature effects

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

2
61
0

Year Published

2004
2004
2024
2024

Publication Types

Select...
6
2

Relationship

0
8

Authors

Journals

citations
Cited by 119 publications
(63 citation statements)
references
References 22 publications
2
61
0
Order By: Relevance
“…The charge drift-based model is not accurate to describe device behaviors in the subthreshold regime. The channel current can be presented as in [19], with a similar expression to conventional transistors,…”
Section: Subthreshold Regimementioning
confidence: 99%
See 2 more Smart Citations
“…The charge drift-based model is not accurate to describe device behaviors in the subthreshold regime. The channel current can be presented as in [19], with a similar expression to conventional transistors,…”
Section: Subthreshold Regimementioning
confidence: 99%
“…Despite that many theories are proposed and reported to describe behaviors of various organic field effect transistors, the widely known ones are based on charge drift [19] in presence of tail-distributed traps [20] and variable range hopping [21]. For the charge drift model, a critical point is to figure out the quantity of charges at the dielectric-semiconductor interface.…”
Section: Model Theory and Derivationmentioning
confidence: 99%
See 1 more Smart Citation
“…where 11 and φ f0 = (E f0 − E C )/q. Herein, ϕ is the electrostatic potential, ε si is the polysilicon material permittivity, q is the electronic charge, V is the quasi-Fermi potential, φ t is the thermal voltage, and E f0 is the Fermi potential: E f0 = φ t ln (N d /n i ).…”
Section: Calculation Of Surface Potentialmentioning
confidence: 99%
“…The TFT switching-off resistance (Roff) cannot be expressed with a simple equation like Ron since it has complicated physical mechanisms (Jacunski, 1999). We note that ambient light dramatically decreases Roff.…”
Section: Hold Processmentioning
confidence: 99%