Abstract:Lepidopteran pests cause considerable damage to all crops over the world. As larvae are directly responsible for these damages, many research efforts are devoted to find plant cultivars which are resistant against them. However, such studies take time, efforts and are costly, especially when one wants to not only find resistance traits but also evaluate their heritability. We present here a high throughput approach to screen plants for resistance or chemicals for their deterrence, using a leaf-disk consumption… Show more
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