2016
DOI: 10.1002/jemt.22623
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A MEMS‐based heating holder for the direct imaging of simultaneous in‐situ heating and biasing experiments in scanning/transmission electron microscopes

Abstract: The introduction of scanning/transmission electron microscopes (S/TEM) with sub-Angstrom resolution as well as fast and sensitive detection solutions support direct observation of dynamic phenomena in-situ at the atomic scale. Thereby, in-situ specimen holders play a crucial role: accurate control of the applied in-situ stimulus on the nanostructure combined with the overall system stability to assure atomic resolution are paramount for a successful in-situ S/ TEM experiment. For those reasons, MEMS-based TEM … Show more

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Cited by 92 publications
(97 citation statements)
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“…MEMS-based heating stages with fast thermal response (up to 10,000K/sec) and accurate temperature measurement [4] offer a powerful tool to monitor microstructure evolution during fast heating and cooling process. Here, we use (in situ) S/TEM methods to observe phase transformations in AM Ti64.…”
mentioning
confidence: 99%
“…MEMS-based heating stages with fast thermal response (up to 10,000K/sec) and accurate temperature measurement [4] offer a powerful tool to monitor microstructure evolution during fast heating and cooling process. Here, we use (in situ) S/TEM methods to observe phase transformations in AM Ti64.…”
mentioning
confidence: 99%
“…However, quality of the EDS and EBSD data is influenced by infrared radiation interference at temperatures above 600°C. This background can be reduced to minimum by employing a microheatingplate device.A novel microheatingplate device based on microelectromechanical systems (MEMS) technology provides a maximum temperature of 1200°C and a very high heating/cooling rate in the order of 10 5 degrees per second [3]. This MEMS chip is able to support nano-scale to sub-millimeter-sized samples (samples with dimensions in tens of µm are typically used).…”
mentioning
confidence: 99%
“…Here we have compared the effects on mono-modal Ag NCs of electron beam heating and in-situ heating using a MEMS based heating stage [3] 1(a)-(c)), presumably due to surface diffusion of Ag underneath the capping layer. During subsequent in situ heating on the MEMS chip, however, the small Ag grains are re-absorbed by the NC, which then spheroidizes prior to sublimation.…”
mentioning
confidence: 99%