Electrically percolating
nanowire networks are among the most promising
candidates for next-generation transparent electrodes. Scientific
interest in these materials stems from their intrinsic current distribution
heterogeneity, leading to phenomena like percolating pathway rerouting
and localized self-heating, which can cause irreversible damage. Without
an experimental technique to resolve the current distribution and
an underpinning nonlinear percolation model, one relies on empirical
rules and safety factors to engineer materials. We introduce Bose–Einstein
condensate microscopy to address the longstanding problem of imaging
active current flow in 2D materials. We report on performance improvement
of this technique whereby observation of dynamic redistribution of
current pathways becomes feasible. We show how this, combined with
existing thermal imaging methods, eliminates the need for assumptions
between electrical and thermal properties. This will enable testing
and modeling individual junction behavior and hot-spot formation.
Investigating both reversible and irreversible mechanisms will contribute
to improved performance and reliability of devices.