A scanning force microscope for in situ observation of electrochemical processes

Abstract

A scanning force microscope (SFM) for electrochemical applications, based on an optical fiber interferometer for force detection, is developed. Cu bulk deposition and dissolution on polycrystalline Au samples were used to demonstrate the performance of the instrument. The time dependence of the nucleation and deposition of Cu grains and their dissolution was monitored by one-dimensional scanning during the reaction. The data show that SFM in an electrochemical environment can be used to investigate inhomogeneous processes in situ on the micron scale. Problems due to electrochemical processes occurring on the SFM cantilevers are, however, of significance and require special attention.

Laser ablation for 3D nanometric imaging of solids

“…Furthermore, repeated transportation of the sample between the SPM and the processing apparatus makes the procedure time-consuming that prevents realtime applications. The second approach, where neither the sample nor the probe is removed during the surface processing, has been successfully applied in cases of selective electrochemical reactions [ 6 ] or selective chemical etching [ 7 ]. The general disadvantage of the approach is that the SPM tip is located in the vicinity of the processing area and can be modified or even destroyed.…”