Abstract:Scanning probe microscopes scan and manipulate a sharp tip in the immediate vicinity of a sample surface. The limited bandwidth of the feedback mechanism used for stabilizing the separation between the tip and the sample makes the fragile nanoscopic tip very susceptible to mechanical instabilities. We propose, demonstrate and characterize a new alternative device based on bulging a thin substrate against a second substrate and rolling them with respect each other. We showcase the power of this method by placin… Show more
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