2022
DOI: 10.1109/tcsi.2021.3098018
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A Robust Area-Efficient Physically Unclonable Function With High Machine Learning Attack Resilience in 28-nm CMOS

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Cited by 9 publications
(2 citation statements)
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“…Although the reliability of PUFs can deteriorate when experiencing a wide variation in temperature or supply voltage variations, new research results show promising results. For example, the 28 nm CMOS PUF proposed in [19] demonstrated robust performance for temperatures in the range of −40 to 100 • C and voltages of 0.5 to 1.4 V.…”
Section: A Overviewmentioning
confidence: 99%
“…Although the reliability of PUFs can deteriorate when experiencing a wide variation in temperature or supply voltage variations, new research results show promising results. For example, the 28 nm CMOS PUF proposed in [19] demonstrated robust performance for temperatures in the range of −40 to 100 • C and voltages of 0.5 to 1.4 V.…”
Section: A Overviewmentioning
confidence: 99%
“…PUF architectures have been continuously enhanced to improve resilience against learning attacks [7], [9], [10], [16], [22]. Other works have tried to design PUFs with nonlinear challenge-response relationship by operating in subthreshold regime [6], [29], or using amplifier chains [28]. Such solutions were effective in improving resilience to classical machine learning approaches [15], but none was shown resistant to recent attacks using deep neural networks [5], [19].…”
Section: Related Workmentioning
confidence: 99%