2009
DOI: 10.1088/0026-1394/46/3/005
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A revised treatment of the influence of the sample support on the measurement of line scales and the consequences for its use to disseminate the unit of length

Abstract: We revisited the treatment of the influence of the support conditions and the resulting bending of a scale on the positions of its graduation lines. In contrast to earlier publications, we did not calculate the position deviation with respect to the case without any bending. Due to the production processes used today, this is inappropriate and leads to an overestimation of the related uncertainty contribution. We also extended the treatment from two lines to all lines of the scale and included a finite startin… Show more

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Cited by 12 publications
(11 citation statements)
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“…The measurement procedure was as follows. First, the scale to be measured was placed at the Bessel points [20] on the alignment stage of the calibration system with an orientation of 0 • and aligned with the measurement axis. Second, the scale was measured four times (two round trips of the moving microscope).…”
Section: Manufactured Line Scales and Procedures For Measurementmentioning
confidence: 99%
“…The measurement procedure was as follows. First, the scale to be measured was placed at the Bessel points [20] on the alignment stage of the calibration system with an orientation of 0 • and aligned with the measurement axis. Second, the scale was measured four times (two round trips of the moving microscope).…”
Section: Manufactured Line Scales and Procedures For Measurementmentioning
confidence: 99%
“…A horizontal bar of great length requires two points of support in the direction of its length to be stable. The position of these standing legs determines the action of the gravity of this bar; depending on how it is supported, measurement errors can be caused [11]. Therefore, if the supports are positioned at the ends, it will warp in the center causing the ends to come closer and tilt upwards.…”
Section: Methodsmentioning
confidence: 99%
“…To obtain small uncertainties of only a few nm over measurement ranges of about 500 mm requires careful analysis of all relevant influences, including alignment errors, Abbe errors [116], dimensional sensitivity of substrates to variations of ambient pressure [204], ambient temperature [190] and mounting of the substrate [115].…”
Section: Medium Range Length Measurement Systems (<05 M)mentioning
confidence: 99%