2009
DOI: 10.1504/ijcmsse.2009.027484
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A review of silicon carbide development in MEMS applications

Abstract: Due to its desirable material properties, Silicon Carbide (SiC) has become an alternative material to replace Si for Microelectromechanical Systems (MEMS) applications in harsh environments. To promote SiC MEMS development towards future cost-effective products, main technology areas in material deposition and processes have attracted significant interest. The developments in these areas have contributed to the rapid emergence of SiC MEMS prototypes. In this paper, we give an overview of the important developm… Show more

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Cited by 66 publications
(44 citation statements)
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“…Several recent reviews have outlined progress in SiC MEMS, but considerable work remains necessary to realize a larger market share beyond current niche applications including high temperature micromechanical resonators in communication transceivers, pressure sensors in the oil industry, and accelerometers in airplane engines or spacecraft. 38,44,45 Many of these challenges revolve around improving fabrication routes. Chemical vapor deposition (CVD) is used almost exclusively for SiC thin film growth, although several variations exist that are specific to the polytype or application.…”
Section: A Sicmentioning
confidence: 99%
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“…Several recent reviews have outlined progress in SiC MEMS, but considerable work remains necessary to realize a larger market share beyond current niche applications including high temperature micromechanical resonators in communication transceivers, pressure sensors in the oil industry, and accelerometers in airplane engines or spacecraft. 38,44,45 Many of these challenges revolve around improving fabrication routes. Chemical vapor deposition (CVD) is used almost exclusively for SiC thin film growth, although several variations exist that are specific to the polytype or application.…”
Section: A Sicmentioning
confidence: 99%
“…LPCVD results in a slower growth rate, but can more easily accommodate the thermal stresses in the thin films. 45 Growth of homoepitaxial 6H-SiC or 4H-SiC must be done at very high temperatures between 1500 and 1650°C, which limits integration into CMOS devices. 44 However, lower temperature (800-1000°C) LPCVD processes have been developed for polycrystalline 3C-SiC films.…”
Section: A Sicmentioning
confidence: 99%
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“…Since the 1990's, silicon carbide (SiC) has gained considerable research and development attention, as an attractive alternative micromachining material to silicon, for realising various microelectromechanical systems (MEMS) sensors and actuators suitable for operation in harsh environments [1][2][3][4][5][6][7]. Thanks to its highly desired material properties such as high physicochemical stability, high hardness, good thermal conductivity, high-temperature operability, wear resistance and chemical inertness.…”
Section: Introductionmentioning
confidence: 99%
“…These characteristics make them suitable as etch masking layers during advanced semiconductor, solar cell and micro-electro mechanical system (MEMS) fabrication. [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16] Examples of these applications include deep etching of glass or silicon, protection of low-K dielectric films, as a stop layer in STI CMP, etc. 10,12,14 The planar surface necessary to use a-SiC as a hard mask in these applications can be potentially achieved using chemical mechanical planarization (CMP). 14 Since, the a-SiC hard mask layers typically protect an underlying dielectric material, generally SiO 2 , the CMP polish process must be selective to it.…”
mentioning
confidence: 99%