2007
DOI: 10.1016/j.nimb.2007.09.031
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A review of ion beam induced charge microscopy

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Cited by 100 publications
(64 citation statements)
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“…Secondly, the carriers lifetimes, which are significantly shorter than in average traditional materials such as CZT, germanium, silicon, enable a full investigation in the effects of carriers recombination in the bulk on the formation of anomalous polarity pulses without the request of ad hoc constraints on the charge collection geometry associated with irradiation, inhomogeneous trap distribution or charge accumulation at the oxide. Thus, the study of the bulk recombination processes in diamond enables us to adopt and validate a general model based on a purely electrostatic approach and relying on the Shockley-Ramo-Gunn (SRGT) theorem [16,17]. The generality of the latter will allow a straightforward application to multi-electrode devices in any detector material, and a further corroboration of results in [1,8,9].…”
mentioning
confidence: 91%
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“…Secondly, the carriers lifetimes, which are significantly shorter than in average traditional materials such as CZT, germanium, silicon, enable a full investigation in the effects of carriers recombination in the bulk on the formation of anomalous polarity pulses without the request of ad hoc constraints on the charge collection geometry associated with irradiation, inhomogeneous trap distribution or charge accumulation at the oxide. Thus, the study of the bulk recombination processes in diamond enables us to adopt and validate a general model based on a purely electrostatic approach and relying on the Shockley-Ramo-Gunn (SRGT) theorem [16,17]. The generality of the latter will allow a straightforward application to multi-electrode devices in any detector material, and a further corroboration of results in [1,8,9].…”
mentioning
confidence: 91%
“…The experimental measurements were carried out with the Ion Beam Induced Charge (IBIC) technique, which allowed the microscopic mapping of the induced pulse height as a function of the excess charge-carriers generation position across the device [16].…”
mentioning
confidence: 99%
“…Devices from the same lot were tested using the Heavy Ion Microbeam at Sandia National Laboratories [47] using a 48 MeV silicon ion beam, with LET of 10 MeV · cm 2 /mg (GaN) [45], and an elliptical spot-size where full-width at half-max (FWHM)(x) = 1 µm and FWHM(y) = 2.4 µm.…”
Section: Iv21 Experimental Setupmentioning
confidence: 99%
“…After exiting the Van de Graaff tandem accelerator, the beam is scanned in the x and y directions over the surface of the device electrostatically [47]. In the case of the Schottky gate device, the substrate is monitored by the scope via conductive epoxy on the backside of the die to capture any substrate transients.…”
Section: Iv21 Experimental Setupmentioning
confidence: 99%
“…Ion beam induced charge (IBIC) imaging [13] measurements were carried out to evaluate the CCE as a function of the spatial position across the detectors. For IBIC measurements the microprobe beam line at the Australian Nuclear Science and Technology Organisation was used to focus 5.5 MeV 4 He 2+ beams produced by the ANTARES accelerator down to ∼ 1 µm diameter.…”
Section: -P2 4 Spatially Resolved Charge Collection Efficiency mentioning
confidence: 99%