A review of devices and methods for measuring thermal emissivity at cryogenic temperatures

Abstract

Thermal emissivity is an important parameter in characterizing the thermal radiative properties of materials and a critical factor in radiative heat transfer. The radiation of an actual object is different from that of the blackbody: its radiation energy varies irregularly with wavelength and temperature. To investigate the thermal radiative properties, thermal emissivity could be measured at cryogenic temperatures. In this paper, measuring methods and factors affecting the thermal emissivity of metals and infrared coatings at low temperatures were comprehensively reviewed. Two existing methods for measuring thermal emissivity at low temperatures, the calorimetry and radiometry methods, were described. Moreover, this work also discussed several factors such as material properties, surface temperature, and surface conditions. Testing devices for measurement of emissivity at low temperatures based on calorimetry and radiometry were reviewed and analyzed emphatically.

The development of a novel apparatus to measure the emissivity of high-roughness materials at 82 K

“…To date, there is no commercial apparatus to measure the emissivity of a material at cryogenic temperatures, which may be a major reason for the scarce information on emissivity data for various materials at cryogenic temperatures. Another reason could be the higher system-running costs and measurement time for a single sample [9][10][11].…”

“…Based on the literature [9,[22][23][24], an emissivity measurement system can be broadly classified into the radiometric method and calorimetric methods. The calorimetric technique is commonly preferred due to its simplicity and precision for steady-state measurements.…”