2020
DOI: 10.1016/j.solener.2020.10.066
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A review of characterization of perovskite film in solar cells by spectroscopic ellipsometry

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Cited by 27 publications
(18 citation statements)
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“…[21] Ellipsometry has previously been employed in the study of lead halide perovskites as reviewed recently by Li et.al. [22] The method offers several advantages including fast, non-destructive measurements that are sensitive to optical constants and the thickness of layered samples. Because it measures the reflective differences among polarized light at various wavelengths and angles, it is generally insensitive to disturbances by environmental light.…”
Section: Introductionmentioning
confidence: 99%
“…[21] Ellipsometry has previously been employed in the study of lead halide perovskites as reviewed recently by Li et.al. [22] The method offers several advantages including fast, non-destructive measurements that are sensitive to optical constants and the thickness of layered samples. Because it measures the reflective differences among polarized light at various wavelengths and angles, it is generally insensitive to disturbances by environmental light.…”
Section: Introductionmentioning
confidence: 99%
“…Differences in the aging of the perovskite could also impact the comparison. Finally, various dispersion models can be used to fit the dielectric function, [ 70 ] leading to differences that also impact the optical indices that are used for simulations.…”
Section: Key Ppsc Materials and Architecturesmentioning
confidence: 99%
“…Differences of aging of the perovskite could also impact the comparison. Finally, various dispersion models can be used to fit the dielectric function [62], leading to differences that also impact the optical indices that are used for simulations.…”
Section: Perovskite Mediummentioning
confidence: 99%