2008
DOI: 10.1039/b812395k
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A reliable methodology for high throughput identification of a mixture of crystallographic phases from powder X-ray diffraction data

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Cited by 35 publications
(30 citation statements)
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“…There have been a number of efforts directed at developing algorithms that allow rapid identification of key trends and features in diffraction data taken across multiphase CCS libraries, and subsequent attribution of such data to individual phases. [400][401][402][403][404][405][406][407] By performing cluster analysis, similar diffraction patterns, even among hundreds of spectra, can be rapidly identified. Similar XRD patterns usually indicate the presence of similar phases in a particular composition region.…”
Section: High-throughput Mapping Of Phase Diagramsmentioning
confidence: 99%
See 1 more Smart Citation
“…There have been a number of efforts directed at developing algorithms that allow rapid identification of key trends and features in diffraction data taken across multiphase CCS libraries, and subsequent attribution of such data to individual phases. [400][401][402][403][404][405][406][407] By performing cluster analysis, similar diffraction patterns, even among hundreds of spectra, can be rapidly identified. Similar XRD patterns usually indicate the presence of similar phases in a particular composition region.…”
Section: High-throughput Mapping Of Phase Diagramsmentioning
confidence: 99%
“…113 The CCS library chip was made by first depositing gradient thicknesses of the precursor layers La 2 O 3 , Mn 3 O 4 , and CaMnO 3 at RT on a (100) LaAlO 3 substrate, followed by annealing at 200 C for several days, 400 C for 30 h, and sintering at 1000 C for 2 h in flowing O 2 ; a predominantly epitaxial library film resulted. To map the magnetic phases, low temperature SSM was carried out at 3 K to7 K, and to track the qualitative change in electrical properties of this CCS film, SMM was performed at RT.…”
Section: B Magnetic Oxidesmentioning
confidence: 99%
“…23 Kusne, et al 24 demonstrated the speed and accuracy of using the L1 norm with a mean shift theory clustering method to provide analysis of XRD data as the data was being collected. Baumes, et al 25 investigated the use of the dynamic time warping (DTW) measure to assist in XRD analysis and found it to be resilient to peak shifting when the range of peak shifting was known. LeBras, et al 26 and Ermon, et al 27 later applied DTW as part of larger constraint programming-based algorithms for concurrent composition-phase map determination and constituent phase identification from XRD data.…”
Section: Introductionmentioning
confidence: 99%
“…A careful inspection of their robustness and the corresponding highlight of specific failures led us to create a new technique: adaptable time warping (ATW). [7] Herein, the design process of the recently proposed ATW strategy is thoroughly detailed in a step-by-step manner. This allows a deep understanding of the motivations, improvements, and the resulting remarkable properties of the methodology.…”
Section: Introductionmentioning
confidence: 99%