Abstract:This paper presents a highly digital calibration technique suitable for high-speed digital-to-analog converters (DACs). The proposed calibration method does not require an adjustment of on-chip analog voltages and can therefore be a favorable method in a deeply scaled nanometer process. The calibration utilizes that adding several redundant unit current cells to predetermined weight groups can be achieved with low hardware overhead, and choosing the best subset out of multitude of combinations leads to accurac… Show more
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