Abstract:The equipment and associated methodology of a new technique for checking the susceptibility of plastic‐encapsulated ICs to moisture ingress is presented. The basis of the new technique is to immerse unbiased ICs in a salt solution and to subject them to high temperatures (in the range 120°C to 175°C) and to high pressures (2 to 9 atmospheres). At the highest temperature, results can be obtained within a few hours, although a 20 h test at 165°C is suggested as a screen for components. The test is extremely simp… Show more
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