This paper reports the content of a lecture presented at the 1995 International Conference and Exhibition on Electronic Measurement and Instrumentation, held in Shanghai, China in 1995. The paper presents (thanks to the courtesy of several scientists) some of the most significant esults recently obtained in the field of short-range microwave imaging. The overview concerns the research activity carried out in Europe and is focused on microwave imaging for non-destructive testing, civil engineering, and scientific and medical applications. This type of imaging is characterized by a relatively short distance between the object to be detected and the probes.which is in general the starting point for microwaveimaging algorithms, is mathematically formulated. Then, the paper provides references to several significant imaging approaches so far proposed. For details of these approaches, the reader is referred to the numerous mentioned papers. Finally, a description of the research activity carried out in Europe is given and some very interesting results are shown.