A proof of concept for reliability aware analysis of junctionless negative capacitance FinFET-based hydrogen sensor
Navneet Gandhi,
Rajeewa Kumar Jaisawal,
Sunil Rathore
et al.
Abstract:This work demonstrates the reliability-aware analysis of the Junctionless Negative Capacitance (NC) FinFET employed as a hydrogen (H2) gas sensor. Gate stacking of the ferroelectric (FE) layer induces internal voltage amplification owing to the NC property, thus, improving the sensitivity of the baseline Junctionless FinFET. A well-calibrated TCAD model is used to investigate the sensing characteristics of the proposed FinFET-based H2 sensor by employing the Palladium (Pd) metallic gate as a sensing element. T… Show more
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