1988
DOI: 10.1107/s0021889888006624
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A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. II. Application and discussion of the methodology

Abstract: The convolutive X-ray peak profile-fitting methodology described in the previous paper [Enzo, Fagherazzi, Benedetti & Polizzi (1988). J. Appl. Cryst. 21,[536][537][538][539][540][541][542] has been applied to a series of fluorite samples milled for different times and two zirconia ultrafine powders, by using either pseudo-Voigt or Voigt (in the Kielkopf approximation) functions, in order to investigate the broadening due to microstructural factors (crystallite size and lattice distortions). In the fluorite m… Show more

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Cited by 96 publications
(45 citation statements)
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(7 reference statements)
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“…X-ray powder diffraction ͑XRPD͒ analyses were performed using a Philips 1710 diffractometer equipped with a copper anode operated at 40 kV and 35 mA, graphite curved monochromator on the diffracted beam, and a proportional counter. The crystallite sizes were determined through analyses of XRD line broadening, using a published program 20,21 with sintered silicon used as a standard.…”
Section: B Microstructural Characterizationmentioning
confidence: 99%
“…X-ray powder diffraction ͑XRPD͒ analyses were performed using a Philips 1710 diffractometer equipped with a copper anode operated at 40 kV and 35 mA, graphite curved monochromator on the diffracted beam, and a proportional counter. The crystallite sizes were determined through analyses of XRD line broadening, using a published program 20,21 with sintered silicon used as a standard.…”
Section: B Microstructural Characterizationmentioning
confidence: 99%
“…In accordance with Wagner, 15,16 the cell edge value was extrapolated by applying a weighted least-square linear fit to the cell edge values calculated from the position of each single reflection as a function of cos cotg. The peak position was obtained using a previously reported best-fitting procedure, 17,18 where each peak is described by a couple of constrained pseudo-Voigt functions (K ␣ 1 and K ␣ 2 profiles͒ and the background by a polynomial function.…”
mentioning
confidence: 99%
“…From peakintegrated intensities, H2a was estimated at 32.0(1)% by volume of the total sample and H2b for the remaining. For a similar procedure, see Benedetti et al (1988). (Figures 1 and 2).…”
Section: Experimental Profilesmentioning
confidence: 99%