A positron annihilation study on the defect properties of doped diamond films

Hu, Xiaojun; Ye, J.S.; Liu, H.J.; Mariazzi, S.; Brusa, R. S.

doi:10.1016/j.tsf.2007.05.016

Cited by 6 publications

(3 citation statements)

References 17 publications

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“…The defects probed by positrons are vacancy-like defects in different diamond films [10][11][12]. The vacancy concentration in the S-doped diamond film is higher than that in undoped diamond films.…”

Section: Resultsmentioning

confidence: 99%

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Defects in Carbon Allotropes Studied by Positron Annihilation

Huang

Chen

Wei

et al. 2008

MSF

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Slow positron beam technique has been employed to study the defects of graphite, nanophase C, as well as the structural changes in un-doped, B-doped and S-doped diamond films with annealing temperatures. The results show that the concentration of defects in nanophase C is higher than that in graphite. The vacancy concentration in the S-doped diamond film is higher than that in un-doped one. The addition of small amount of B atoms leads to the decrease of the vacancy concentration in the film. The vacancy concentration in un-doped diamond film would decrease after annealing at temperature below 600°C, while vacancy concentration will increase after annealing at temperatures above 900°C. The vacancy concentration in the 40 Ω cm B-doped diamond film decreases at annealing temperatures higher than 200°C.

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Section: Resultsmentioning

confidence: 99%

“…The S and W parameter as a function of positron implantation energy were measured for graphite, nanophase C, undoped, B-doped and S-doped diamond films by the slow positron beam of the University of Trento [9,10].…”

Section: Methodsmentioning

confidence: 99%

Defects in Carbon Allotropes Studied by Positron Annihilation

Huang

Chen

Wei

et al. 2008

MSF

View full text Add to dashboard Cite

show abstract

“…Positron annihilation technique (PAT) can provide unique information about defects and has many advantages in structural characteristic. It is a nondestructive and effective method to detect the information of defects [8], whereas there are few studies about SFMO using this technique recently. Photodoping, which remains the component and structure of material unchanged, is an effective way to improve the property [9,10].…”

Section: Introductionmentioning

confidence: 99%