1981
DOI: 10.1016/0038-1098(81)90886-3
|View full text |Cite
|
Sign up to set email alerts
|

A physical interpretation of dispersive transport in disordered semiconductors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

12
230
0
6

Year Published

2003
2003
2021
2021

Publication Types

Select...
5
4

Relationship

0
9

Authors

Journals

citations
Cited by 729 publications
(252 citation statements)
references
References 10 publications
12
230
0
6
Order By: Relevance
“…͑40͒ is directly related to the classical results on dispersive ͑power-law͒ behavior of the mobility in transient experiments 29 in disordered semiconductors. Figure 4 illustrates the behavior of the trap capacitance as a function of the frequency.…”
Section: ͑36͒mentioning
confidence: 79%
See 1 more Smart Citation
“…͑40͒ is directly related to the classical results on dispersive ͑power-law͒ behavior of the mobility in transient experiments 29 in disordered semiconductors. Figure 4 illustrates the behavior of the trap capacitance as a function of the frequency.…”
Section: ͑36͒mentioning
confidence: 79%
“…28,29 Therefore, one can switch from the regime, where the traps remain in equilibrium, to that in which they dominate the transient response. 30 In this paper we provide a full solution of the relaxation of the exponential distribution of traps, which unifies both regimes of behavior in a single framework, in the frequency domain.…”
Section: Introductionmentioning
confidence: 99%
“…The concept of a 'mobility edge' has greatly facilitated our understanding of electronic transport in a disordered system 47 . The mobility edge is a boundary located in the band tail, in which states above it are extended states with band transport, while those below it are localized states that conduct via thermally assisted mechanisms such as Mott variable range hopping (VRH) [48][49][50] or an Arrhenius-type activated behaviour 51 . Four-point variable temperature measurements were performed on our devices from 4.4 to 400 K as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…2 and 3, the maximum of the energy histogram E max lies always above and approximately at a constant distance with respect to the Fermi level. If we would assume that E max can be assimilated to the transport energy, this behavior would lead to a constant diffusion coefficient according to eqn (9).…”
Section: Diffusion Coefficient and Transport Energymentioning
confidence: 99%