A parallel plate resonator technique for microwave loss measurements on superconductors

Taber, R. C.

doi:10.1063/1.1141389

Cited by 216 publications

(64 citation statements)

References 15 publications

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“…Usually, high e r spacers, e.g., LaAlO 3 (e r = 25) and Ba(Zn 1/3 Ta 2/3 )O 3 (e r = 29) instead of Teflon (e r = 2.1), can reduce radiation loss of the PPR and lead to higher unloaded Q. An inverse square root law between radiation loss and dielectric constant can be derived [15], so the higher dielectric constant, the lower radiation loss, i.e., lower a. The conduction loss is inversely proportional to thickness of spacers.…”

Section: Theoretical Principle and Experiments Methodsmentioning

confidence: 99%

“…The sharp peaks in S 21 or S 12 diagram correspond to the resonant modes. These modes can be distinguished from the cavity modes easily by observing the shift of resonate frequency [15][16][17] with the change of temperature, while the cavity modes do not shift obviously.…”

Section: Theoretical Principle and Experiments Methodsmentioning

confidence: 99%

“…The conduction loss is inversely proportional to thickness of spacers. b is given by b ¼ 1=ðf Â pl 0 Þ ¼ 3:9 Â 10 À5 m X -1 at 6.5 GHz, where f is resonant frequency [15].…”

Section: Theoretical Principle and Experiments Methodsmentioning

confidence: 99%

“…The resonator is then placed inside a small cavity made of oxygen free high-conductivity copper (OFHC) which is gold (purity [99.9 %) plated to minimize the radiation loss. The details of this device are well described in some references [15][16][17][18][19][20] [10][11][12][13][14]. The ceramic was sintered by traditional powder processing method [1][2][3].…”

Section: Theoretical Principle and Experiments Methodsmentioning

confidence: 99%

“…The microwave loss due to conductivity of metal cavity wall often limits the sensitivity of loss tangent measurement. Superconducting parallel plate resonator (PPR), a parallel plate capacitor structure with two superconducting films back to back and a dielectric spacer between them was first introduced by Taber [15] to measure the RF surface resistance of superconductor films. This method was then extensively utilized in research studies [16][17][18][19][20][21][22].…”

Section: Introductionmentioning

confidence: 99%

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Measurement of dielectric loss tangent at cryogenic temperature using superconducting film resonator

Zhang

Wang

2015

J Theor Appl Phys

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We demonstrate that the superconducting film resonator can be used to accurately and quantitatively measure the microwave dielectric loss tangent of a variety of materials. Compared to traditional dielectric resonator loaded metal cavity method, it has advantage of small sample size (*2-3 orders of magnitude smaller than the old method), and much higher sensitivity to measure small loss tangent values as small as 10 -5 at around 7 GHz band at cryogenic temperatures. This method can be utilized widely in study of mechanism of microwave loss at cryogenic temperature range, which is extremely important in superconducting microwave application areas, such as novel super quantum computers.

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Section: Theoretical Principle and Experiments Methodsmentioning

confidence: 99%

Section: Theoretical Principle and Experiments Methodsmentioning

confidence: 99%

“…The conduction loss is inversely proportional to thickness of spacers. b is given by b ¼ 1=ðf Â pl 0 Þ ¼ 3:9 Â 10 À5 m X -1 at 6.5 GHz, where f is resonant frequency [15].…”

Section: Theoretical Principle and Experiments Methodsmentioning

confidence: 99%

Section: Theoretical Principle and Experiments Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Measurement of dielectric loss tangent at cryogenic temperature using superconducting film resonator

Zhang

Wang

2015

J Theor Appl Phys

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Quantum statistics model for calculating microwave properties of high-temperature superconductors

Abbas

1996

Microw. Opt. Technol. Lett.

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due to the surface waves-in the complex plane, research regarding the complex eigenvalue (complex propagation constant) has been done with the ZEPLS procedure [7]. NUMERICAL RESULTS Received 1-1 7-96 KEY TERMSHigh-temperature superconductors, quantum statistical model, microwave properties of superconductors ABSTRACT The temperature and frequency dependences of the quality factors (Qs, and the resonant frequency of a planar microwave high-temperature superconductor (HTS) are investigated on the basis of quantum-particle statistics. Comparisons are made beiween the theoretically deriued results and experimental results for Q values and the resonant frequency. 0 1996 John Wiley & Sons, Inc.

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Measurements of dielectric constants and surface resistance for millimeter and submillimeter wavelength region using Josephson effect

Kawakami¹,

Wang²,

Komiyama³

1994

Electron Comm Jpn Pt II

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Josephson junctions with microstrip resonators fabricated. By observing the current steps caused by the mutual interaction between the high‐frequency current due to the ac Josephson effect and resonator, the dielectric constants of the dielectric thin films (a‐Si, SiO, and SiO2) and surface resistance of an Nb thin film at 4.2 K in the millimeter and submillimeter wavelength region were evaluated. As a result, it was found that this method was effective in determining the dielectric constant and surface resistance. In the device used, a Josephson junction was placed at the center of the microstrip resonator. the resonator length was varied from 217 to 2740 μm, the measurements were carried out at a frequency ranging from about 30 to 310 GHz, while the device was biased with dc voltage. the relative dielectric constants of the materials were rather independent of the frequency, where Ωa‐Si = 14.5 ± 0.5, ϵSiO 5.5 ± 0.4, and ϵSiO2 = 4.4 ± 0.4. the surface resistances of the Nb thin films were 1 to 6 mω when the frequencies were 70 to 180 GHz.

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A parallel plate resonator technique for microwave loss measurements on superconductors

Abstract: Measurement of the absolute penetration depth and surface resistance of superconductors and normal metals with the variable spacing parallel plate resonator Rev.

Cited by 216 publications

References 15 publications

Measurement of dielectric loss tangent at cryogenic temperature using superconducting film resonator

Measurement of dielectric loss tangent at cryogenic temperature using superconducting film resonator

Quantum statistics model for calculating microwave properties of high-temperature superconductors

Measurements of dielectric constants and surface resistance for millimeter and submillimeter wavelength region using Josephson effect

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