A Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources

Erdogan, E.S.; Ozev, Sule

doi:10.1109/vts.2009.44

Cited by 5 publications

(3 citation statements)

References 20 publications

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“…and (16) and (17) Expanding (14) and then substituting the resulting components in accordance to (15), (16), and (17), and then considering only the resulting sine terms whose frequency is in order to extract from the general expression, we arrive at the closed form expression for as shown in (19) at the bottom of the next page, where has a value 0 for even and 1 for odd , as defined in (18), shown at the bottom of the next page.…”

Section: Computing Rf Performance Parametersmentioning

confidence: 99%

“…Below we provide details on the analysis leading to (19) by expanding on the transition from (14) to (19) using (15) Replacing the summation variable with and using the definition in (8), (38) can be rewritten as . For the second term of (37), has to be equal to ; thus, for all values of , except for , which translates to the condition .…”

Section: Appendixmentioning

confidence: 99%

“…Test schemes, including built-in ones, with simplified hardware and sophisticated signal processing have been attempted, but the approaches targeted low frequency analog circuits [12] or were specific to narrowband RF components and require stimulus bandpass filters [13]. Loopback test schemes have also been addressed, where only baseband signals are considered [14]. However, while loopback schemes can be employed in transceiver DUTs, they cannot be used for testing receiver-only DUTs, like those used in broadcast applications.…”

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confidence: 99%

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Phase-Aware Multitone Digital Signal Based Test for RF Receivers

Zeidan

Banerjee²,

Gharpurey

et al. 2012

IEEE Trans. Circuits Syst. I

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This paper presents a method for testing RF receivers that utilizes a multitone digital signal generation scheme and relies on the analysis of the receiver baseband output to compute the RF performance parameters. The proposed method eliminates the cost of expensive RF instrumentation on the input side of receiver testing and only requires low-cost on-chip baseband digitization at the output of the receiver. The complexity of the RF signal generation inherent to standard methods is traded off with extensive signal processing in the baseband. The analysis necessary for tackling the problem of extracting RF metrics is addressed and presented herein. Whereas the proposed test scheme was implemented and experimentally verified on a load board for testing UHF receivers, generalized use in BIST applications in need of multi-GHz RF stimuli is also discussed in the paper. RF performance parameters like Gain, Noise Figure (NF), and IIP3 were simulated and measured using both standard methods and the proposed method and, the results are shown to be accurate to within 0.5 dB for Gain and 1 dB for NF and IIP3.

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Section: Computing Rf Performance Parametersmentioning

confidence: 99%