A novel technique to determine difference contours between digital and physical objects for projection moiré interferometry

Kimber, Mark; Blotter, Jonathan D.

doi:10.1016/j.optlaseng.2005.02.004

Cited by 2 publications

(2 citation statements)

References 12 publications

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“…A drawback of projection moiré techniques is associated with the projection‐oriented nature of this method. Applications with non‐viewable, hidden or inaccessible surfaces exclude the use of projection moiré [4].…”

Section: Introductionmentioning

confidence: 99%

Interpretation of Fringes Produced by Time‐Averaged Projection Moiré

Ragulskis

Navickas

2011

Strain

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New exact formulas describing the observed shift of projected moiré grating lines on a surface of an object are derived for the paraxial model. These formulas enable to construct more accurate explicit relationship among the amplitude of oscillation, the pitch of the projected grating and the order of the fringe. Analytical derivations and numerical illustrations are used throughout the text to explain the process of formation of double‐exposure and time‐averaged projection moiré fringes.

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Section: Introductionmentioning

confidence: 99%

Interpretation of Fringes Produced by Time‐Averaged Projection Moiré

Ragulskis

Navickas

2011

Strain

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“…Moiré interferometry is a high-sensitivity moiré method which has been successfully applied to solving ranges of problems in material mechanics [1][2][3]. Automatic analysis of the resulted fringe patterns in moiré interferometry was also developed.…”

Section: Introductionmentioning

confidence: 99%

Carrier fringe method of moiré interferometry for tiny strain measurements in micro-field

Cao

Wang

et al. 2008

Acta Mech Sin

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In this paper, we demonstrate a new optical method for tiny strain measurements based on the principle of carrier fringes of moiré interferometry. A cross-line grating with frequency of 1200 lp/mm is replicated on the specimen surface, and the strain can be deduced from the changes in carrier fringes before and after the deformation of an object. Four coherent laser beams are used to obtain the carrier fringe patterns of field U and V . Both theoretical analysis and numerical simulation indicate that the ideal accuracy of strain can be controlled within a range of ±1µε. Case study of a plane extension experiment shows that the measurement accuracy of strain can be controlled within the range of ±10µε. The average strain values of every row of field U and every column of field V can be obtained by using this method, and approximated strain of every pixel in the whole-field can be further acquired, and thus it is possible to measure tiny strains occurred in a micro-field. The technology in this paper can provide comprehensive information for analyzing related mechanical content in the field of MEMS.

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A novel technique to determine difference contours between digital and physical objects for projection moiré interferometry

Cited by 2 publications

References 12 publications

Interpretation of Fringes Produced by Time‐Averaged Projection Moiré

Interpretation of Fringes Produced by Time‐Averaged Projection Moiré

Carrier fringe method of moiré interferometry for tiny strain measurements in micro-field

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