1993
DOI: 10.1016/0168-9002(93)90340-n
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A novel technique for fast pulse-shaping using a slow amplifier at LHC

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Cited by 46 publications
(9 citation statements)
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“…Fig. 7 shows the averaged deconvoluted output against signal injection time, which allows direct observation of the weighting function [13] of the filter. In comparison with the calculated cusp-like function the practical form of the weighting function has very little discontinuity at the peak and is almost gaussian in shape.…”
Section: Apv3 Laboratory Test Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…Fig. 7 shows the averaged deconvoluted output against signal injection time, which allows direct observation of the weighting function [13] of the filter. In comparison with the calculated cusp-like function the practical form of the weighting function has very little discontinuity at the peak and is almost gaussian in shape.…”
Section: Apv3 Laboratory Test Resultsmentioning
confidence: 99%
“…An impulse is recovered by forming a weighted sum of several samples from successive time intervals; the method is explained in ref. [13]. Three samples are used, and if a signal occurs at time interval n, the voltage samples S n-1 , S n and S n+1 are read from the pipeline when the chip is triggered (fig 2).…”
Section: Apv3 Architecture and Designmentioning
confidence: 99%
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“…Pulse-shape analysis is described in the literature, and it has been widely adopted [3][4][5][6][7][8][9][10][11][12][13][14]. It usually consists in a rough estimation of two parameters (which are somehow related to the two main time constants of the impulse response}see, e.g.…”
Section: Introduction and Problem Statementmentioning
confidence: 99%
“…This is being carried out by systematic studies of the radiation hardness of detectors by production of a wide range of prototypes with several manufacturers. They are being evaluated in conjunction with a fast, low noise front end amplifier, analogue pipeline and a novel signal processing scheme developed specifically for LHC [3,4]. Both p-side and n-side microstrips and test devices, fabricated on n-type silicon, have been exposed to irradiation by neutrons, protons, photons and electrons.…”
Section: Introductionmentioning
confidence: 99%