A Novel Scheme of Control Chart Patterns Recognition in Autocorrelated Processes
Cang Wu,
Huijuan Hou,
Chunli Lei
et al.
Abstract:Control chart pattern recognition (CCPR) can quickly recognize anomalies in charts, making it an important tool for narrowing the search scope of abnormal causes. Most studies assume that the observations are normal, independent and identically distributed (NIID), while the assumption of independence cannot always be satisfied under continuous manufacturing processes. Recent research has considered the existence of autocorrelation, but the recognition rate is overestimated. In this paper, a novel scheme is pro… Show more
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